Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials / Yoshio Waseda.
Saved in:
Personal Name(s): | Waseda, Yoshio. |
---|---|
Imprint: |
Berlin :
Springer,
1984.
|
Physical Description: |
VI, 183 S. |
Note: |
Includes index englisch |
ISBN: |
0387133593 (U.S.) |
Series Title: |
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Lecture notes in physics ;
204. |
Keywords: |
anomalous x-ray scattering : disordered system |
Classification: | |
Shelf Classification: |
LEADER | 01176cam a2200301 n 4500 | ||
---|---|---|---|
001 | 21818 | ||
005 | 19971031000000.0 | ||
008 | r1984 | ||
020 | |a 0387133593 (U.S.) | ||
035 | |a (Sirsi) a28890 | ||
084 | 0 | |a FHCF - Defect characterization |2 ZB | |
084 | 0 | |a FHCB - X-ray scattering |2 ZB | |
084 | 0 | |a FEF - Disorder in solids |2 ZB | |
084 | 1 | |a FHC - Beugungsverfahren in der Materialcharakterisierung |2 LS | |
245 | 0 | 0 | |a Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials / |c Yoshio Waseda. |
246 | 0 | 0 | |a Anomalous (resonance) X-ray scattering for structural characterization of disordered materials. |
260 | |a Berlin : |b Springer, |c 1984. | ||
300 | |a VI, 183 S. | ||
490 | 0 | |a Lecture notes in physics ; |v 204. | |
500 | |a Includes index | ||
500 | |a englisch | ||
596 | |a 1 | ||
653 | |a anomalous x-ray scattering : disordered system | ||
700 | 1 | |a Waseda, Yoshio. | |
900 | |a S 001137-0204'01' | ||
900 | |a FHC 018 | ||
908 | |a Monographie, Sammelwerk | ||
949 | |a FHC 018 |w LC |c 1 |i 1084005979 |d 28/8/2017 |e 31/7/2017 |l STACKS |m ZB |n 12 |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |