Charakterisierung epitaktischer GaAs/AlGaAs-Schichtsysteme mittels Streuung harter Röntgenstrahlen unter streifendem Einfall sowie Röntgenbeugung [E-Book] / Uwe Klemradt
Characterization of epitaxial gaas/algaas layer systems using hard x-ray scattering under grazing incidence and x-ray diffraction
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Full text JuSER |
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Personal Name(s): | Klemradt, Uwe, author |
Imprint: |
Jülich :
Forschungszentrum, Zentralbibliothek,
1994
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Physical Description: |
1 Online-Ressource (144 Seiten) |
Note: |
deutsch |
Series Title: |
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Berichte des Forschungszentrums Jülich ;
2894 |
Dissertation Note: |
Zugleich: Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen
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Subject (ZB): | |
Classification: |
Characterization of epitaxial gaas/algaas layer systems using hard x-ray scattering under grazing incidence and x-ray diffraction |