Anwendung der hochauflösenden Elektronenenergieverlustspektroskopie zum Studium von Halbleiterschichtsystemen [E-Book] / von Arnold Förster
study of semiconductor layer systems by high resolution electron energy loss spectroscopy (hreels).
Saved in:
Full text JuSER |
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Personal Name(s): | Förster, Arnold, author |
Imprint: |
Jülich :
Kernforschungsanlage, Zentralbibliothek,
1988
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Physical Description: |
1 Online-Ressource (104 Seiten) |
Note: |
deutsch |
Series Title: |
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Berichte der Kernforschungsanlage Jülich ;
2247 |
Dissertation Note: |
Zugleich: Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen
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Classification: |
study of semiconductor layer systems by high resolution electron energy loss spectroscopy (hreels). |