The Effects of defect trapping and radiation-induced solute segregation on void swelling [Microfiche] / P. R. Okamoto, N. Q. Lam, and H. Wiedersich.

Saved in:
Okamoto, P. R.
Lam, N. Q. / Wiedersich, H.
Argonne, Ill. : Argonne National Laboratory, 1977.
[36] leaves.
Prepared for Workshop on Correlation of Neutron and Charged-particle Damage, Oak Ridge National Laboratory, Oak Ridge, Tennessee, June 8-9, 1977
Photocopy of typescript
void : segregation

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