Seeman Bohlin X-ray diffractometer for thin films [Microfiche]
Saved in:
Personal Name(s): | Feder, R. |
---|---|
Berry, B. S. | |
Imprint: |
Köbenhavn :
Munksgaard,
1970.
|
Physical Description: |
42 Bl. |
Note: |
englisch |
Subject (ZB): | |
Classification: |
LEADER | 00673cam a2200217 n 4500 | ||
---|---|---|---|
001 | 31281 | ||
005 | 19980218000000.0 | ||
008 | r1970 | ||
035 | |a (Sirsi) a35639 | ||
084 | 0 | |a FCAB - X-ray crystallography, X-ray diffraction |2 ZB | |
245 | 0 | 0 | |a Seeman Bohlin X-ray diffractometer for thin films |h [Microfiche] |
260 | |a Köbenhavn : |b Munksgaard, |c 1970. | ||
300 | |a 42 Bl. | ||
500 | |a englisch | ||
596 | |a 1 | ||
650 | 4 | |a X-ray diffractometer | |
700 | 1 | |a Feder, R. | |
700 | 1 | |a Berry, B. S. | |
900 | |a B 051003'01' | ||
908 | |a Bericht, Gutachten | ||
949 | |a B 051003'01' |w LC |c 1 |i 1080007447 |l STACKS |m ZB |r Y |s Y |t ZBB |u 25/3/2009 |x ZB-F |1 PRINT |