Optical characterization of epitaxial semiconductor layers.
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Personal Name(s): | Bauer, G., editor |
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Imprint: |
Berlin :
Springer,
1996.
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Physical Description: |
XIV, 429 S. |
Note: |
englisch |
ISBN: |
9783540591290 354059129X |
Keywords: |
high resolution X-ray diffraction analysis of epitaxial growth |
Subject (ZB): | |
Classification: | |
Shelf Classification: |
ZB | |
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Reading Room Call number: FHA 012 Barcode: 1096102031 Available |