Physics : International congress on electron microscopy 0009 vol. 0001 : Annual meeting of the Microscopical Society of Canada 0005 : Annual meeting of the Electron Microscopy Society of America 0036 : Toronto, 01.08.78-09.08.78.

Saved in:
Sturgess, J. M., (editor)
Toronto : Microscopical Society of Canada, 1978.
XXXII, 684 S.
englisch
0920622062
9780920622063
International Congress on Electron Microscopy ; 9,1.
conference canada : electron microscopy
electron microscopy : instrumentation : image analysis : theory
electron microscopy : holography : defect analysis : radiation damage : surface analysis : deformation : phase study

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