Physics : International congress on electron microscopy 0009 vol. 0001 : Annual meeting of the Microscopical Society of Canada 0005 : Annual meeting of the Electron Microscopy Society of America 0036 : Toronto, 01.08.78-09.08.78.
Saved in:
Personal Name(s): | Sturgess, J. M., editor |
---|---|
Imprint: |
Toronto :
Microscopical Society of Canada,
1978.
|
Physical Description: |
XXXII, 684 S. |
Note: |
englisch |
ISBN: |
0920622062 9780920622063 |
Series Title: |
/* Depending on the record driver, $field may either be an array with
"name" and "number" keys or a flat string containing only the series
name. We should account for both cases to maximize compatibility. */?>
International Congress on Electron Microscopy ;
9,1. |
Keywords: |
conference canada : electron microscopy electron microscopy : instrumentation : image analysis : theory electron microscopy : holography : defect analysis : radiation damage : surface analysis : deformation : phase study |
Subject (ZB): | |
Classification: |
ZB | |
---|---|
Open Stacks Call number: S 000659-0009,01'01' Barcode: 1079002634 Available |