Secondary ion mass spectrometry: international conference 0002 : SIMS 0002 : Stanford, CA, 27.08.79-31.08.79.

Saved in:
Benninghoven, A., (editor)
Berlin : Springer, 1979.
XIII, 298 S.
englisch
9783540098430
9780387098432
3540098437
0387098437
Springer series in chemical physics ; vol 0009.

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