Secondary ion mass spectrometry: international conference 0002 : SIMS 0002 : Stanford, CA, 27.08.79-31.08.79.
Saved in:
Personal Name(s): | Benninghoven, A., editor |
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Imprint: |
Berlin :
Springer,
1979.
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Physical Description: |
XIII, 298 S. |
Note: |
englisch |
ISBN: |
9783540098430 9780387098432 3540098437 0387098437 |
Series Title: |
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Springer series in chemical physics ;
vol 0009. |
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