Transmission Electron Microscopy [E-Book] : Diffraction, Imaging, and Spectrometry / edited by C. Barry Carter, David B. Williams.
Carter, C. Barry, (editor)
Williams, David B., (editor)
Cham : Springer, 2016
XXXIII, 518 p. 300 illus. online resource.
englisch
9783319266510
10.1007/978-3-319-26651-0
Full Text
Table of Contents:
  • Foreword by Sir John Meurig Thomas
  • 1. Electron Sources
  • 2. In Situ and Operando
  • 3. Electron Diffraction and Phase Identification
  • 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns
  • 5. Electron crystallography, charge-density mapping and nanodiffraction
  • 6. Digital Micrograph
  • 7. Electron waves, interference & coherence
  • 8. Electron Holography
  • 9. Focal-Series Reconstruction
  • 10. Direct Methods For Image Interpretation
  • 11. Imaging in the STEM
  • 12. Electron Tomography
  • 13. Energy-Filtered Transmission Electron Microscopy
  • 14. Calculation of Electron Energy-Loss Spectra
  • 15. Electron Diffraction & X-Ray Excitation
  • 16. X-Ray and Electron Energy-Loss Spectral Imaging
  • 17. Practical Aspects and Advanced Applications of XEDS.