Scanning electron microscopy. 1978,1 : Los-Angeles, CA, 17.04.1978-21.04.1978 : An international review of advances in instrumentation, techniques, theory and physical applications of the scanning electron microscope.

Saved in:
Johari, O., (editor)
AMF-O'Hare, IL : Scanning Electron Microscopy, 1978.
XIV, 898 S.
englisch
0931288010
0931288002
9780931288029
9780931288005
0931288029
9780931288012
Scanning electron microscopy ; 1978,1.
scanning electron microscopy : conference united states
scanning electron microscopy : materials science

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