Scanning electron microscopy. 1980,1 : Chicago, IL, 21.04.1980-25.04.1980 : An international journal of scanning electron microscopy, related techniques, and applications.
Saved in:
Personal Name(s): | Johari, O., editor |
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Imprint: |
AMF-O'Hare,IL :
Scanning Electron Microscopy,
1980.
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Physical Description: |
XVI, 608 S. |
Note: |
englisch |
ISBN: |
0931288150 9780931288159 0931288118 9780931288111 |
Series Title: |
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Scanning electron microscopy ;
1980,1. |
Keywords: |
scanning electron microscopy : conference united states scanning electron microscopy : materials science |
Classification: |
IBI-1 | |
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Institute Call number: S 003531-1980,1'01' Barcode: 1080006636 Available |