Fundamentals of Nanoscale Film Analysis [E-Book] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer.
Alford, Terry L. (author)
Feldman, Leonard C. (author) / Mayer, James W. (author)
Boston, MA : Springer US, 2007
XIV, 336 p. online resource.
englisch
9780387292618
10.1007/978-0-387-29261-8
Full Text
Table of Contents:
  • An Overview: Concepts, Units, and the Bohr Atom
  • Atomic Collisions and Backscattering Spectrometry
  • Energy Loss of Light Ions and Backscattering Depth Profiles
  • Sputter Depth Profiles and Secondary Ion Mass Spectroscopy
  • Ion Channeling
  • Electron-Electron Interactions and the Depth Sensitivity of Electron Spectroscopies
  • X-ray Diffraction
  • Electron Diffraction
  • Photon Absorption in Solids and EXAFS
  • X-ray Photoelectron Spectroscopy
  • Radiative Transitions and the Electron Microprobe
  • Nonradiative Transitions and Auger Electron Spectroscopy
  • Nuclear Techniques: Activation Analysis and Prompt Radiation Analysis
  • Scanning Probe Microscopy.