Scanning Microscopy for Nanotechnology [E-Book] : Techniques and Applications / edited by Weilie Zhou, Zhong Lin Wang.
Wang, Zhong Lin. (editor)
Zhou, Weilie. (editor)
New York, NY : Springer New York, 2007
XIV, 522 p. 399 illus. online resource.
englisch
9780387396200
10.1007/978-0-387-39620-0
Full Text
Table of Contents:
  • Fundamentals of Scanning Electron Microscopy (SEM)
  • Backscattering Detector and EBSD in Nanomaterials Characterization
  • X-ray Microanalysis in Nanomaterials
  • Low kV Scanning Electron Microscopy
  • E-beam Nanolithography Integrated with Scanning Electron Microscope
  • Scanning Transmission Electron Microscopy for Nanostructure Characterization
  • to In-Situ Nanomanipulation for Nanomaterials Engineering
  • Applications of FIB and DualBeam for Nanofabrication
  • Nanowires and Carbon Nanotubes
  • Photonic Crystals and Devices
  • Nanoparticles and Colloidal Self-assembly
  • Nano-building Blocks Fabricated through Templates
  • One-dimensional Wurtzite Semiconducting Nanostructures
  • Bio-inspired Nanomaterials
  • Cryo-Temperature Stages in Nanostructural Research.