Applied Scanning Probe Methods III [E-Book] : Characterization / edited by Bharat Bhushan, Harald Fuchs.
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scop...
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Full text |
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| Personal Name(s): | Bhushan, Bharat. editor |
| Fuchs, Harald. editor | |
| Imprint: |
Berlin, Heidelberg :
Springer,
2006
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| Physical Description: |
XLIV, 378 p. 270 illus., 2 illus. in color. online resource. |
| Note: |
englisch |
| ISBN: |
9783540269106 |
| DOI: |
10.1007/b138285 |
| Series Title: |
NanoScience and Technology
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| Subject (LOC): |
- Atomic Force Microscopy in Nanomedicine
- Scanning Probe Microscopy: From Living Cells to the Subatomic Range
- Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces
- Probing Macromolecular Dynamics and the Influence of Finite Size Effects
- Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum
- One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures
- Scanning Probe Microscopy Applied to Ferroelectric Materials
- Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy
- AFM Applications for Contact and Wear Simulation
- AFM Applications for Analysis of Fullerene-Like Nanoparticles
- Scanning Probe Methods in the Magnetic Tape Industry.