Applied Scanning Probe Methods II [E-Book] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs.
The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope,...
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Full text |
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| Personal Name(s): | Bhushan, Bharat. editor |
| Fuchs, Harald. editor | |
| Imprint: |
Berlin, Heidelberg :
Springer,
2006
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| Physical Description: |
XLIII, 420 p. online resource. |
| Note: |
englisch |
| ISBN: |
9783540274537 |
| DOI: |
10.1007/b139097 |
| Series Title: |
NanoScience and Technology
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| Subject (LOC): |
- Higher Harmonics in Dynamic Atomic Force Microscopy
- Atomic Force Acoustic Microscopy
- Scanning Ion Conductance Microscopy
- Spin-Polarized Scanning Tunneling Microscopy
- Dynamic Force Microscopy and Spectroscopy
- Sensor Technology for Scanning Probe Microscopy and New Applications
- Quantitative Nanomechanical Measurements in Biology
- Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale
- Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices
- Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures
- Focused Ion Beam as a Scanning Probe: Methods and Applications.