Synthetic Polymeric Membranes [E-Book] : Characterization by Atomic Force Microscopy / by K. C. Khulbe, C. Y. Feng, Takeshi Matsuura.
Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on...
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Full text |
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Personal Name(s): | Khulbe, K. C. author |
Feng, C. Y. author / Matsuura, Takeshi. author | |
Imprint: |
Berlin, Heidelberg :
Springer,
2008
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Physical Description: |
XVIII, 198 p. 146 illus. online resource. |
Note: |
englisch |
ISBN: |
9783540739944 |
DOI: |
10.1007/978-3-540-73994-4 |
Series Title: |
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Springer Laboratory
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Subject (ZB): | |
Subject (LOC): |
- Synthetic Membranes for Membrane Processes
- Atomic Force Microscopy
- Nodular Structure of Polymers in the Membrane
- Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface
- Cross-sectional AFM Image
- Adhesion
- Membrane Surface Morphology and Membrane Performance.