Applied Scanning Probe Methods IX [E-Book] : Characterization / edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs.
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VII...
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Full text |
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Personal Name(s): | Bhushan, Bharat. editor |
Fuchs, Harald. editor / Tomitori, Masahiko. editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
2008
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Physical Description: |
LIX, 387 p. online resource. |
Note: |
englisch |
ISBN: |
9783540740834 |
DOI: |
10.1007/978-3-540-74083-4 |
Series Title: |
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Nano Science and Technolgy
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Subject (LOC): |
- Ultrathin Fullerene-Based Films via STM and STS
- Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode
- Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers
- Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells
- Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope
- Cellular Physiology of Epithelium and Endothelium
- Application of Atomic Force Microscopy to the Study of Expressed Molecules in or on a Single Living Cell
- What Can Atomic Force Microscopy Say About Amyloid Aggregates?
- Atomic Force Microscopy: Interaction Forces Measured in Phospholipid Monolayers, Bilayers and Cell Membranes
- Self-Assembled Monolayers on Aluminum and Copper Oxide Surfaces: Surface and Interface Characteristics, Nanotribological Properties, and Chemical Stability
- High Sliding Velocity Nanotribological Investigations of Materials for Nanotechnology Applications
- Measurement of the Mechanical Properties of One-Dimensional Polymer Nanostructures by AFM
- Evaluating Tribological Properties of Materials for Total Joint Replacements Using Scanning Probe Microscopy
- Near-Field Optical Spectroscopy of Single Quantum Constituents.