Applied Scanning Probe Methods XI [E-Book] : Scanning Probe Microscopy Techniques / by Bharat Bhushan, Harald Fuchs.
Saved in:
Full text |
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Personal Name(s): | Bhushan, Bharat. author |
Fuchs, Harald. author | |
Imprint: |
Berlin, Heidelberg :
Springer,
2009
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Physical Description: |
LVI, 236 p. 113 illus., 22 illus. in color. online resource. |
Note: |
englisch |
ISBN: |
9783540850373 |
DOI: |
10.1007/978-3-540-85037-3 |
Series Title: |
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NanoScience and Technology
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Subject (LOC): |
- Oscillation Control in Dynamic SPM with Quartz Sensors
- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation
- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies
- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science
- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements
- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip
- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations
- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.