Nanoscale Phenomena in Ferroelectric Thin Films [E-Book] / edited by Seungbum Hong.
This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well k...
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Full text |
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Personal Name(s): | Hong, Seungbum, editor |
Imprint: |
Boston, MA :
Springer,
2004
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Physical Description: |
XIV, 288 p. online resource. |
Note: |
englisch |
ISBN: |
9781441990440 |
DOI: |
10.1007/978-1-4419-9044-0 |
Series Title: |
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Multifunctional Thin Film Series
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Subject (LOC): |
- I. Electrical Characterization in Nanoscale Ferroelectric Capacitor
- I. Testing and characterization of ferroelectric thin film capacitors
- II. Size effects in ferroelectric film capacitors: role of the film thickness and capacitor size
- III. Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy
- IV. Nanoscale domain dynamics in ferroelectric thin films
- V. Polarization switching and fatigue of ferroelectric thin films studied by PFM
- II Nano Domain Manipulation and Visualization in Ferroelectric Materials
- VI. Domain switching and self-polarization in perovskite thin films
- VII. Dynamic-contact electrostatic force microscopy and its application to ferroelectric domain
- VIII. Polarization and charge dynamics in ferroelectric materials with SPM
- IX. Nanoscale investigation of MOCVD-Pb(Zr,Ti)O3 thin films using scanning probe microscopy
- X. SPM measurements of ferroelectrics at MHz frequencies
- XI Application of ferroelectric domains in nanometer scale for high- density storage devices.