Secondary Ion Mass Spectrometry SIMS II [E-Book] : Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979 / edited by A. Benninghoven, C. A. Evans, R. A. Powell, R. Shimizu, H. A. Storms.
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Full text |
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| Personal Name(s): | Benninghoven, A., editor |
| Evans, C. A., editor / Powell, R. A., editor / Shimizu, R., editor / Storms, H. A., editor | |
| Imprint: |
Berlin, Heidelberg :
Springer,
1979
|
| Physical Description: |
XIV, 300 p. online resource. |
| Note: |
englisch |
| ISBN: |
9783642618710 |
| DOI: |
10.1007/978-3-642-61871-0 |
| Series Title: |
Springer Series in Chemical Physics ;
9 |
| Subject (LOC): |
- I. Fundamentals Chairpersons: D.E. Harrison and C.A. Evans, Jr.
- II. Quantitation Chairpersons: D.B. Wittry and P. Williams
- III. Semiconductors Chairpersons: C.W. Magee and W. Werner
- IV. Static SIMS Chairperson: A. Benninghoven
- V. Metallurgy Chairpersons: J.D. Brown and A.P. von Rosenstiel
- VI. Instrumentation Chairpersons: D.S. Simons and F.G. Rüdenauer
- VII. Geology Chairpersons: J. Okano and C. Meyer
- VIII. Panel Discussion Chairperson: I.L. Kofsky
- IX. Biology Chairpersons: M.S. Burns and G.H. Morrison
- X. Combined Techniques Chairpersons: C. Johnson and W.H. Christie
- XI. Postdeadline Papers
- Index of Authors.