Characterization of Crystal Growth Defects by X-Ray Methods [E-Book] / edited by Brian K. Tanner, D. Keith Bowen.
Bowen, D. Keith, (editor)
Tanner, Brian K., (editor)
Boston, MA : Springer, 1980
XXVI, 589 p. 556 illus. online resource.
englisch
9781475711264
10.1007/978-1-4757-1126-4
Nato Advanced Study Institutes Series, Series B. Physics ; 63
Full Text
Table of Contents:
  • 1 Industrial Implications of Crystal Quality
  • 2 The Technical Importance of Growth Defects
  • 3 Defects and their Detectability in Melt-Grown Crystals
  • 4 Defects and Their Detectability
  • 5 Defect Generation in Metal Crystals
  • 6 Defects in Non-metal Crystals
  • 7 Defect Visualisation: Individual Defects
  • 8 Experimental Techniques for the Study of Statistically Distributed Defects
  • 9 Elementary Dynamical Theory
  • 10 Perfect and Imperfect Crystals
  • 11 X-ray Sources
  • 12 X-ray Detectors
  • 13 Sample Preparation
  • 14 Laboratory Techniques for X-ray Reflection Topography
  • 15 Laboratory Techniques for Transmission X-ray Topography
  • 16 White Beam Synchrotron Radiation Topography
  • 17 Control of Wavelength, Polarization, Time-Structure and Divergence for Synchrotron Radiation Topography
  • 18 Monochromatic Synchrotron Radiation Topography
  • 19 Environmental Stages and Dynamic Experiments
  • 20 Technology and Costs of X-Ray Diffraction Topography
  • 21 X-Ray TV Imaging and Real-Time Experiments +
  • 22 Computer Modelling of Crystal Growth and Dissolution
  • 23 Microradiography and Absorption Microscopy
  • 24 Reciprocal Lattice Spike Topography
  • 25 Reflection Topography: Panel Discussion
  • Appendix I Designing a Topographic Experiment
  • Appendix 2 Defects and Artifacts
  • Appendix 3 Exercises in Diffraction Contrast
  • Appendix 4 Stereographic Projection Description for X-Ray Topography: Subgrain Boundaries and Stereo-Pairs
  • Appendix 5 Dispersion Surface Exercises
  • Appendix 6 Contrast of Stacking Faults
  • Appendix 7 Misfit Boundaries and Junctions of Purely Rotational Boundaries
  • Sponsors, Organising Committee, Advisory Panel
  • Chemical Formula Index.