Advanced Computing in Electron Microscopy [E-Book] / by Earl J. Kirkland.
pending.
Saved in:
Full text |
|
Personal Name(s): | Kirkland, Earl J., author |
Imprint: |
Boston, MA :
Springer,
1998
|
Physical Description: |
IX, 250 p. 60 illus. online resource. |
Note: |
englisch |
ISBN: |
9781475744064 |
DOI: |
10.1007/978-1-4757-4406-4 |
Subject (LOC): |
- 1 Introduction
- 2 The Transmission Electron Microscope
- 3 Linear Image Approximations
- 4 Sampling and the Fast Fourier Transform
- 5 Simulating Images of Thin Specimens
- 6 Simulating Images of Thick Specimens
- 7 Multislice Applications and Examples
- 8 The Programs on the CD-ROM
- A Plotting CTEM/STEM Transfer Functions
- B Files on the CD-ROM
- C The Fourier Projection Theorem
- D Atomic Potentials and Scattering Factors
- D.1 Atomic Charge Distribution
- D.2 X-Ray Scattering Factors
- D.3 Electron Scattering Factors
- D.4 Parameterization
- E Bilinear Interpolation
- F 3D Perspective View.