Transmission Electron Microscopy of Semiconductor Nanostructures: Analysis of Composition and Strain State [E-Book] / by Andreas Rosenauer.
This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods i...
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Full text |
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Personal Name(s): | Rosenauer, Andreas, author |
Imprint: |
Berlin, Heidelberg :
Springer,
2003
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Physical Description: |
XII, 241 p. 233 illus., 47 illus. in color. online resource. |
Note: |
englisch |
ISBN: |
9783540364078 |
DOI: |
10.1007/3-540-36407-2 |
Series Title: |
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Springer Tracts in Modern Physics ;
182 |
Subject (LOC): |
- Theoretical Fundamentals of Transmission Electron Microscopy
- Electron Diffraction
- Image Formation
- Digital Image Analysis
- Strain State Analysis
- Lattice Fringe Analysis
- Applications
- In0.6Ga0.4As/GaAs(001) SK Layers
- InAs Quantum Dots
- Electron Holography: AlAs/GaAs Superlattices
- Outlook.