Transmission Electron Microscopy of Semiconductor Nanostructures: Analysis of Composition and Strain State [E-Book] / by Andreas Rosenauer.
Rosenauer, Andreas, (author)
Berlin, Heidelberg : Springer, 2003
XII, 241 p. 233 illus., 47 illus. in color. online resource.
englisch
9783540364078
10.1007/3-540-36407-2
Springer Tracts in Modern Physics ; 182
Full Text
Table of Contents:
  • Theoretical Fundamentals of Transmission Electron Microscopy
  • Electron Diffraction
  • Image Formation
  • Digital Image Analysis
  • Strain State Analysis
  • Lattice Fringe Analysis
  • Applications
  • In0.6Ga0.4As/GaAs(001) SK Layers
  • InAs Quantum Dots
  • Electron Holography: AlAs/GaAs Superlattices
  • Outlook.