X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures [E-Book] / by Martin Schmidbauer.
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevanc...
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Full text |
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Personal Name(s): | Schmidbauer, Martin, author |
Imprint: |
Berlin, Heidelberg :
Springer,
2004
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Physical Description: |
X, 204 p. online resource. |
Note: |
englisch |
ISBN: |
9783540399865 |
DOI: |
10.1007/b13608 |
Series Title: |
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Springer Tracts in Modern Physics ;
199 |
Subject (LOC): |
- A Brief Introduction to the Topic
- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures
- Experimental Optimization
- A Model System: LPE SiGe/Si(001) Islands
- Dynamical Scattering at Grazing Incidence
- Characterization of Quantum Dots
- Characterization of Interface Roughness
- Appendix.