Surface Analysis Methods in Materials Science [E-Book] / edited by D. John O’Connor, Brett A. Sexton, Roger St. C. Smart.
O’Connor, D. John, (editor)
Sexton, Brett A., (editor) / Smart, Roger St. C., (editor)
Berlin, Heidelberg : Springer, 1992
XXI, 453 p. online resource.
englisch
9783662027677
10.1007/978-3-662-02767-7
Springer Series in Surface Sciences ; 23
Full Text
Table of Contents:
  • 1. Solid Surfaces, Their Structure and Composition
  • 2. UHV Basics
  • 3. Electron Microscope Techniques for Surface Characterization
  • 4. Sputter Depth Profiling
  • 5. SIMS — Secondary Ion Mass Spectrometry
  • 6. Auger Spectroscopy and Scanning Auger Microscopy
  • 7. X-Ray Photoelectron Spectroscopy
  • 8. Fourier Transform Infrared Specroscopy of Surfaces
  • 9. Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis
  • 10. Scanning Tunnelling Microscopy
  • 11. Low Energy Ion Scattering
  • 12. Reflection High Energy Electron Diffraction
  • 13. Low Energy Electron Diffraction
  • 14. Ultraviolet Photoelectron Spectroscopy of Solids
  • 15. Spin Polarized Electron Techniques
  • 16. Materials Technology
  • 17. Characterization of Catalysts by Surface Analysis
  • 18. Applications to Devices and Device Materials
  • 19. Characterization of Oxidized Surfaces
  • 20. Coated Steel
  • 21. Thin Film Analysis
  • 22. Identification of Adsorbed Species
  • IV Appendix
  • Acronyms Used in Surface and Thin Film Analysis
  • Surface Science Bibliography.