Transmission Electron Microscopy [E-Book] : Physics of Image Formation and Microanalysis / by Ludwig Reimer.
Reimer, Ludwig, (author)
Third Edition.
Berlin, Heidelberg : Springer, 1993
XIV, 545 p. online resource.
englisch
9783662215562
10.1007/978-3-662-21556-2
Springer Series in Optical Sciences ; 36
Full Text
Table of Contents:
  • 1. Introduction
  • 2. Particle Optics of Electrons
  • 3. Wave Optics of Electrons
  • 4. Elements of a Transmission Electron Microscope
  • 5. Electron-Specimen Interactions
  • 6. Scattering and Phase Contrast for Amorphous Specimens
  • 7. Kinematical and Dynamical Theory of Electron Diffraction
  • 8. Diffraction Contrast and Crystal-Structure Imaging
  • 9. Analytical Electron Microscopy
  • 10. Specimen Damage by Electron Irradiation
  • References.