Near-field Nano/Atom Optics and Technology [E-Book] / edited by Motoichi Ohtsu.
Ohtsu, Motoichi, (editor)
Tokyo : Springer, 1998
XIV, 302 p. online resource.
englisch
9784431679370
10.1007/978-4-431-67937-0
Full Text
Table of Contents:
  • 1. Introduction
  • 1.1 Near-Field Optics and Related Technologies
  • 1.2 History of Near-Field Optics and Related Technologies
  • 1.3 Basic Features of an Optical Near Field
  • 1.4 Building Blocks of Near-Field Optical Systems
  • 1.5 Comments on the Theory of Near-Field Optics
  • 1.6 Composition of This Book
  • References
  • 2. Principles of the Probe
  • 2.1 Basic Probe
  • 2.2 Functional Probe: New Contrast Mechanisms
  • References
  • 3. Probe Fabrication
  • 3.1 Introduction
  • 3.2 Selective Etching of a Silica Fiber Composed of a Core and Cladding
  • 3.3 Selective Etching of a Dispersion Compensating Fiber
  • 3.4 Protrusion-Type Probe
  • 3.5 Hybrid Selective Etching of a Double-Cladding Fiber
  • 3.6 Probe for Ultraviolet NOM Applications
  • References
  • 4. High-Throughput Probes
  • 4.1 Introduction
  • 4.2 Excitation of the HE-Plasmon Mode
  • 4.3 Multiple-Tapered Probes
  • References
  • 5. Functional Probes
  • 5.1 Introduction
  • 5.2 Methods of Fixation
  • 5.3 Selecting a Functional Material
  • 5.4 Probe Characteristics and Applications
  • 5.5 Future Directions
  • References
  • 6. Instrumentation of Near-Field Optical Microscopy
  • 6.1 Operation Modes of NOM
  • 6.2 Scanning Control Modes
  • References
  • 7. Basic Features of Optical Near-Field and Imaging
  • 7.1 Resolution Characteristics
  • 7.2 Factors Influencing Resolution
  • 7.3 Polarization Dependence
  • References
  • 8. Imaging Biological Specimens
  • 8.1 Introduction
  • 8.2 Observation of Flagellar Filaments by c-Mode NOM
  • 8.3 Observation of Subcellular Structures of Neurons by i-Mode NOM
  • 8.4 Imaging of Microtubules by c-Mode NOM
  • 8.5 Imaging of Fluorescent-Labeled Biospecimens
  • 8.6 Imaging DNA Molecules by Optical Near-Field Intensity Feedback
  • References
  • 9. Diagnosing Semiconductor Nano-Materials and Devices
  • 9.1 Fundamental Aspects of Near-Field Study of Semiconductors
  • 9.2
  • 9.3 Low-Temperature Single Quantum Dot Spectroscopy
  • 9.4 Ultraviolet Spectroscopy of Polysilane Molecules
  • 9.5 Raman Spectroscopy of Semiconductors
  • 9.6 Diagnostics of Al Stripes in an Integrated Circuit
  • References
  • 10. Toward Nano-Photonic Devices
  • 10.1 Introduction
  • 10.2 Use of Surface Plasmons
  • 10.3 Application to High-Density Optical Memory
  • References
  • 11. Near-Field Optical Atom Manipulation: Toward Atom Photonics
  • 11.1 Introduction
  • 11.2 Cylindrical Optical Near Field for Atomic Quantum Wires
  • 11.3 Atomic Quantum Wires
  • 11.4 Optically Controlled Atomic Deposition
  • 11.5 Near-Field Optical Atomic Funnels
  • 11.6 Atomic Quantum Dots
  • 11.7 Future Outlook
  • References
  • 12. Related Theories
  • 12.1 Comparison of Theoretical Approaches
  • 12.2 Semi-microscopic and Microscopic Approaches
  • 12.3 Numerical Examples
  • 12.4 Effective Field and Massive Virtual Photon Model
  • 12.5 Future Direction
  • References.