Microscopy of Semiconducting Materials [E-Book] : Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK / edited by A. G. Cullis, J. L. Hutchison.
Cullis, A. G., (editor)
Hutchison, J. L., (editor)
Berlin, Heidelberg : Springer, 2005
XVI, 540 p. online resource.
englisch
9783540319153
10.1007/3-540-31915-8
Springer Proceedings in Physics ; 107
Full Text
Table of Contents:
  • Epitaxy: Wide Band-Gap Nitrides
  • Epitaxy: Silicon-Germanium Alloys
  • Epitaxy: Growth and Defect Phenomena
  • High Resolution Microscopy and Nanoanalysis
  • Self-Organised and Quantum Domain Structures
  • Processed Silicon and Other Device Materials
  • Device Studies
  • Scanning Electron and Scanning Probe Advances.