Microscopy of Semiconducting Materials [E-Book] : Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK / edited by A. G. Cullis, J. L. Hutchison.
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of...
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Full text |
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Personal Name(s): | Cullis, A. G., editor |
Hutchison, J. L., editor | |
Imprint: |
Berlin, Heidelberg :
Springer,
2005
|
Physical Description: |
XVI, 540 p. online resource. |
Note: |
englisch |
ISBN: |
9783540319153 |
DOI: |
10.1007/3-540-31915-8 |
Series Title: |
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Springer Proceedings in Physics ;
107 |
Subject (LOC): |
- Epitaxy: Wide Band-Gap Nitrides
- Epitaxy: Silicon-Germanium Alloys
- Epitaxy: Growth and Defect Phenomena
- High Resolution Microscopy and Nanoanalysis
- Self-Organised and Quantum Domain Structures
- Processed Silicon and Other Device Materials
- Device Studies
- Scanning Electron and Scanning Probe Advances.