Swift ion beam analysis in nanosciences [E-Book] / Denis Jalabert, Ian Vickridge, Amal Chabli.
Jalabert, Denis, (author)
Chabli, Amal, (author) / Vickridge, Ian, (author)
London, UK : ISTE, Ltd. ; 2017
Wiley,
1 online resource.
englisch
9781119005063
1119008670
9781119008675
111900506X
Nanoscience and nanotechnology series
Full Text
Table of Contents:
  • Introduction
  • Fundamentals of ion-solid interactions with a focus on the nanoscale ;
  • General considerations ;
  • Basic physical concepts ;
  • Channeling, shadowing and blocking ;
  • 1D layers : limits to depth resolution ;
  • 2D and 3D objects : aspects of lateral resolution
  • Instruments and methods ;
  • Instruments ;
  • Methods
  • Applications ;
  • Example of resonances/light element profiling ;
  • Quantitative analysis/heavy element profiling ;
  • Examples of HR-ERD analysis ;
  • Channeling/defect profiling ;
  • Blocking/strain profiling ;
  • 3D MEIS/real space structural analysis
  • The place of nanoIBA in the characterization forest ;
  • Introduction ;
  • Scope of physical and chemical characterization ;
  • Ion-based characterization techniques overview ;
  • Ion-mass-spectroscopy-based characterization techniques versus IBA ;
  • Other characterization techniques versus IBA ;
  • Emerging ion-beam-based techniques.