Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland [E-Book]
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Full text |
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Personal Name(s): | Goodhew, Peter J. |
Beanland, R. / Humphreys, F. J. | |
Edition: |
3rd edition |
Imprint: |
London :
Taylor & Francis,
2001
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Physical Description: |
xi, 251 pages : illustrations |
Note: |
englisch |
Subject (LOC): |
Description not available. |