Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability [E-Book] / editor, D.J. Dumin.
Saved in:
|
Full text |
|
| Personal Name(s): | Dumin, D. J. |
| Imprint: |
[River Edge, NJ] :
World Scientific,
c2002
|
| Physical Description: |
ix, 270 pages : illustrations |
| Note: |
englisch |
| Series Title: |
Selected topics in electronics and systems ;
v. 23 |
| Subject (LOC): |
| Description not available. |