Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability [E-Book] / editor, D.J. Dumin.
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Full text |
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Personal Name(s): | Dumin, D. J. |
Imprint: |
[River Edge, NJ] :
World Scientific,
c2002
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Physical Description: |
ix, 270 pages : illustrations |
Note: |
englisch |
Series Title: |
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Selected topics in electronics and systems ;
v. 23 |
Subject (LOC): |
Description not available. |