Lock-in Thermography [E-Book] : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signa...
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Full text |
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Personal Name(s): | Breitenstein, Otwin, author |
Schubert, Martin C, author / Warta, Wilhelm, author | |
Edition: |
3rd ed. 2018. |
Imprint: |
Cham :
Springer,
2018
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Physical Description: |
XXI, 321 pages 126 illustrations, 68 illustrations in color (online resource) |
Note: |
englisch |
ISBN: |
9783319998251 |
DOI: |
10.1007/978-3-319-99825-1 |
Series Title: |
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Springer Series in Advanced Microelectronics ;
10 |
Subject (LOC): |
- Introduction
- Physical and Technical Basics
- Experimental Technique
- Theory
- Measurement Strategies
- Typical Applications
- Summary and Outlook. .