Springer Handbook of Microscopy [E-Book] / edited by Peter W. Hawkes, John C.H. Spence.
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel micros...
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Full text |
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Personal Name(s): | Hawkes, Peter W., editor |
Spence, John C.H., editor | |
Edition: |
1st edition 2019. |
Imprint: |
Cham :
Springer,
2019
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Physical Description: |
XXXII, 1543 pages 1140 illustrations in color (online resource) |
Note: |
englisch |
ISBN: |
9783030000691 |
DOI: |
10.1007/978-3-030-00069-1 |
Series Title: |
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Springer Handbooks
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Subject (LOC): |
- Part A: Electron and Ion Microscopy
- Kirkland et al.: Atomic Resolution Transmission Electron Microscopy
- Nellist: Scanning Transmission Electron Microscopy
- Ross & Minor: In situ Transmission Electron Microscopy
- Plitzko & Baumeister: Crytoelectron TEM
- Erdmann et al: Scanning Electron Microscopy
- Thiel: Variable Pressure Scanning Electron Microscopy
- Botton, Pradhudev: Analytical Electron Microscopy
- Campbell et al: High-Speed Electron Microscopy
- Bauer: LEEM, SPLEEM and SPELEEM
- Feng & Scholl: Photoemission Electron Microscopy
- Tromp: Spectroscopy with the Low Energy Electron Microscope
- Van Aert: Model-Based Electron Microscopy
- Hawkes & Krivanek: Aberration Correctors, Monochromators, Spectrometer
- Hlawacek: Ion Microscopy.-Kelly: Atom-Probe Tomography
- Part B: Holography, Ptychography and Diffraction
- Dunin-Borkowski et al.: Electron Holography.-Rodenburg & Maiden: Ptychography
- Zuo: Electron Nanodiffraction
- Musumeci & Li: High-Energy Time-Resolved Electron Diffraction
- Spence: Diffractive Imaging of Single Particles
- Part C: Photon-based Microscopy
- Diaspro et al: Fluorescence Microscopy
- Sahl et al.: Far-Field Fluorescence Microscopy
- Jacobson et al: Zone-Plate X-Ray Microscopy
- Lin et al: Microcomputed Tomography
- Part D: Applied Microscopy
- Huey et al: Scanning Probe Microscopy in Materials Science
- Leary & Midgeley: Electron Tomography in Materials Science
- Sutter: Scanning Tunneling Microscopy in Surface Science
- Hamidian et al: Visualizing electronic quantum matter
- Ma et al (Terasaki): Microscopy of Nanoporous Crystals
- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography
- Amrein & Stamov: Atomic Force Microscopy in the Life Sciences
- Jones: Microscopy in Forensic Sciences.