Transmission electron microscopy of minerals and rocks [E-Book] / Alex C. McLaren.
McLaren, Alex C., (author)
Second edition.
Cambridge : Cambridge University Press, 1991
1 online resource (x, 387 pages)
Cambridge topics in mineral physics and chemistry ; 2
Full Text
LEADER 02340nam a22003378i 4500
001 CR9780511529382
003 UkCbUP
008 090409s1991||||enk o ||1 0|eng|d
020 |a 9780511529382 
020 |a 9780521350983 
020 |a 9780521359436 
035 |a (Sirsi) a794979 
041 |a eng 
082 0 0 |a 549/.12  |2 20 
100 1 |a McLaren, Alex C.,  |e author 
245 1 0 |a Transmission electron microscopy of minerals and rocks  |h [E-Book] /  |c Alex C. McLaren. 
250 |a Second edition. 
264 1 |a Cambridge :  |b Cambridge University Press,  |c 1991  |e (CUP)  |f CUP20200108 
300 |a 1 online resource (x, 387 pages) 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 |a Cambridge topics in mineral physics and chemistry ;  |v 2 
500 |a englisch 
520 |a Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of crystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Minerals and Rocks is an introduction to the principles of the technique written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. A knowledge of elementary crystallography is assumed, and some familiarity with optics and electromagnetic theory is helpful but not essential. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures. 
650 0 |a Mineralogy, Determinative. 
650 0 |a Transmission electron microscopy. 
856 4 0 |u  |z Volltext 
932 |a CambridgeCore (Order 30059) 
596 |a 1 
949 |a XX(794979.1)  |w AUTO  |c 1  |i 794979-1001  |l ELECTRONIC  |m ZB  |r N  |s Y  |t E-BOOK  |u 8/1/2020  |x UNKNOWN  |z UNKNOWN  |1 ONLINE