Advanced Computing in Electron Microscopy [E-Book] / by Earl J. Kirkland.
This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complic...
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Full text |
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Personal Name(s): | Kirkland, Earl J., author |
Edition: |
3rd edition 2020. |
Imprint: |
Cham :
Springer,
2020
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Physical Description: |
XII, 354 pages 146 illustrations, 8 illustrations in color (online resource) |
Note: |
englisch |
ISBN: |
9783030332600 |
DOI: |
10.1007/978-3-030-33260-0 |
Subject (LOC): |
- Introduction
- The Transmission Electron Microscope
- Some Image Approximations
- Sampling and the Fast Fourier Transform
- Calculation of Images of Thin Specimens
- Theory of Calculation of Images of Thick Specimens
- Multislice Applications and Examples
- The Programss
- App. A: Plotting Transfer Functions
- App. B: The Fourier Projection Theorem
- App. C: Atomic Potentials and Scattering Factors
- App. D: The Inverse Problem
- App. E: Bilinear Interpolation
- App. F: 3D Perspective View.