Annual review of materials science. 12.
Saved in:
Personal Name(s): | Huggins, R. A., editor |
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Imprint: |
Palo-Alto, CA :
Annual Reviews,
1982.
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Physical Description: |
444 S. |
Note: |
englisch |
ISBN: |
0824317122 9780824317126 |
Series Title: |
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Annual review of materials science ;
12. |
Keywords: |
ultrasonic tomography for nondestructive testing synchrotron radiation topography applications of photoacoustic spectroscopy recent developments in rapidly melt- quenched crystalline alloys low pressure chemical vapor deposition spray pyrolysis processing metalorganic chemical vapor deposition (MOCVD) laser processing of semiconductor materials recombination enhanced reactions in semiconductors transition metal oxide gels and colloids magnetic susceptibilities of highly conducting one- dimensional materials molecular beam epitaxy of III-V compounds: application of MBE grown films high temperature aerospace materials prepared by powder metallurgy metallurgy of rechargeable metal hydrides status of thin film photovoltaic technologies Rutherford backscattering and channeling analysis of interfaces and epitaxial structures crystal structure of fast ion conductors |
Classification: | |
Shelf Classification: |
ZB | |
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Reading Room Call number: FAF 003-12 Barcode: 1082003952 Available |