Point defects in semiconductors. 0002 : Experimental aspects.

Saved in:
Bourgoin, J.
Lannoo, M.
Berlin : Springer, 1983.
XVI, 295 S.
englisch
9780387115153
0387115153
3540115153
9783540115151
Springer series in solid-state sciences ; vol 0035.
crystal defect in semiconductors : defect electronic structure : jahn teller effect : esr : electronic transport in semiconductors : defect recovery
crystal defect in semiconductors
radiation damage in semiconductors

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