Point defects in semiconductors. 0002 : Experimental aspects.
Saved in:
Personal Name(s): | Bourgoin, J. |
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Lannoo, M. | |
Imprint: |
Berlin :
Springer,
1983.
|
Physical Description: |
XVI, 295 S. |
Note: |
englisch |
ISBN: |
9780387115153 0387115153 3540115153 9783540115151 |
Series Title: |
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Springer series in solid-state sciences ;
vol 0035. |
Keywords: |
crystal defect in semiconductors : defect electronic structure : jahn teller effect : esr : electronic transport in semiconductors : defect recovery crystal defect in semiconductors radiation damage in semiconductors |
Classification: | |
Shelf Classification: |
ZB | |
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Reading Room Call number: FJH 037-35 Barcode: 1083002990 Available | |
Open Stacks Call number: S 003921-0035'01' Barcode: 1083002693 Available |