Bourgoin, J., & Lannoo, M. (1983). Point defects in semiconductors. 0002: Experimental aspects. Berlin: Springer.
Chicago Style CitationBourgoin, J., andfavorite M. Lannoo. Point Defects in Semiconductors. 0002: Experimental Aspects. Berlin: Springer, 1983.
MLA CitationBourgoin, J., andfavorite M. Lannoo. Point Defects in Semiconductors. 0002: Experimental Aspects. Berlin: Springer, 1983.
Warning: These citations may not always be 100% accurate.