This title appears in the Scientific Report :
2010
Please use the identifier:
http://dx.doi.org/10.1103/PhysRevB.82.060505 in citations.
Please use the identifier: http://hdl.handle.net/2128/10979 in citations.
Evidence for triplet superconductivity in Josephson junctions with ferromagnetic Cu2MnAl-Heusler barriers
Evidence for triplet superconductivity in Josephson junctions with ferromagnetic Cu2MnAl-Heusler barriers
We have studied Josephson junctions with barriers prepared from the Heusler compound Cu2MnAl. In the as-prepared state the Cu2MnAl layers are nonferromagnetic and the critical Josephson current density j(c) decreases exponentially with the thickness of the Heusler layers d(F). On annealing the junct...
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Personal Name(s): | Sprungmann, D. |
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Westerholdt, K. / Zabel, H. / Weides, M. / Kohlstedt, H. | |
Contributing Institute: |
Elektronische Materialien; IFF-6 JARA-FIT; JARA-FIT |
Published in: | Physical Review B Physical review / B, 82 82 (2010 2010) 6 6, S. 060505 060505 |
Imprint: |
College Park, Md.
APS
2010
|
Physical Description: |
060505 |
DOI: |
10.1103/PhysRevB.82.060505 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Physical Review B
82 |
Subject (ZB): | |
Link: |
Get full text OpenAccess OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/10979 in citations.
We have studied Josephson junctions with barriers prepared from the Heusler compound Cu2MnAl. In the as-prepared state the Cu2MnAl layers are nonferromagnetic and the critical Josephson current density j(c) decreases exponentially with the thickness of the Heusler layers d(F). On annealing the junctions at 240 degrees C the Heusler layers develop ferromagnetic order and we observe a dependence j(c)(d(F)) with j(c) strongly enhanced and weakly thickness dependent in the thickness range 7.0 < d(F) < 10.6 nm. We interpret this feature as an indication of a triplet component in the superconducting pairing function generated by the specific magnetization profile inside thin Cu2MnAl layers. |