This title appears in the Scientific Report :
2010
Characterization of GdScO3 layers by spectroscopic ellipsometry
Characterization of GdScO3 layers by spectroscopic ellipsometry
Saved in:
Personal Name(s): | Moers, J. |
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Roeckerath, M. / Schubert, J. / Mantl, S. / Grützmacher, D. | |
Contributing Institute: |
Halbleiter-Nanoelektronik; IBN-1 JARA-FIT; JARA-FIT |
Published in: |
EMRS |
Imprint: |
2010
|
Conference: | Strasbourg, Frankreich 2010-06-07 |
Document Type: |
Talk (non-conference) |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |