This title appears in the Scientific Report :
2013
Please use the identifier:
http://dx.doi.org/10.1016/j.nima.2010.04.101 in citations.
The FE-I4 pixel readout integrated circuit
The FE-I4 pixel readout integrated circuit
A new pixel readout integrated circuit denominated FE-I4 is being designed to meet the requirements of ATLAS experiment upgrades. It will be the largest readout IC produced to date for particle physics applications, filling the maximum allowed reticle area. This will significantly reduce the cost of...
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Personal Name(s): | Garcia-Sciveres, M. (Corresponding author) |
---|---|
Arutinov, D. / Barbero, M. / Beccherle, R. / Dube, S. / Elledge, D. / Fleury, J. / Fougeron, D. / Gensolen, F. / Gnani, D. / Gromov, V. / Hemperek, T. / Karagounis, M. / Kluit, R. / Kruth, A. / Mekkaoui, A. / Menouni, M. / Schipper, J. -D. | |
Contributing Institute: |
Zentralinstitut für Elektronik; ZEA-2 |
Published in: | Nuclear instruments & methods in physics research / A, 636 (2011) 1, S. S155 - S159 |
Imprint: |
Amsterdam
North-Holland Publ. Co.
2011
|
Physical Description: |
155–159 |
DOI: |
10.1016/j.nima.2010.04.101 |
Conference: | 7th International ""Hiroshima"" Symposium on the Development and Application of Semiconductor Tracking Detectors, Hiroshima (Japan), 29082009 - 01092009 |
Document Type: |
Contribution to a conference proceedings Journal Article |
Research Program: |
ohne Topic |
Publikationsportal JuSER |
A new pixel readout integrated circuit denominated FE-I4 is being designed to meet the requirements of ATLAS experiment upgrades. It will be the largest readout IC produced to date for particle physics applications, filling the maximum allowed reticle area. This will significantly reduce the cost of future hybrid pixel detectors. In addition, FE-I4 will have smaller pixels and higher rate capability than the present generation of LHC pixel detectors. Design features are described along with simulation and test results, including low power and high rate readout architecture, mixed signal design strategy, and yield hardening. |