This title appears in the Scientific Report :
2000
Please use the identifier:
http://dx.doi.org/10.1063/1.1305462 in citations.
Please use the identifier: http://hdl.handle.net/2128/805 in citations.
Size analysis of nanocrystals in semiconductor doped silicate glasses with anomalous small-angle x ray and Raman scattering
Size analysis of nanocrystals in semiconductor doped silicate glasses with anomalous small-angle x ray and Raman scattering
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Personal Name(s): | Irmer, G. (Corresponding author) |
---|---|
Monecke, J. / Verma, P. / Goerigk, G. / Herms, M. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF Streumethoden; IFF-4 |
Published in: | Journal of applied physics, 88 (2000) 4, S. 1873 - 1879 |
Imprint: |
Melville, NY
American Institute of Physics
2000
|
Physical Description: |
1873 - 1879 |
DOI: |
10.1063/1.1305462 |
Document Type: |
Journal Article |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung ohne Topic |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/805 in citations.
Description not available. |