This title appears in the Scientific Report : 2013 

Reconstruction of SNOM near-field images from rigorous optical simulations by including topography artifacts
Ermes, Markus (Corresponding author)
Lehnen, Stephan / Bittkau, Karsten / Carius, Reinhard
Photovoltaik; IEK-5
2013
SPIE Optical Metrology 2013, Munich, , Germany (Germany), 2013-05-13 - 2013-05-16
Conference Presentation
Thin Film Photovoltaics
Description not available.