This title appears in the Scientific Report :
2013
Reconstruction of SNOM near-field images from rigorous optical simulations by including topography artifacts
Reconstruction of SNOM near-field images from rigorous optical simulations by including topography artifacts
Saved in:
Personal Name(s): | Ermes, Markus (Corresponding author) |
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Lehnen, Stephan / Bittkau, Karsten / Carius, Reinhard | |
Contributing Institute: |
Photovoltaik; IEK-5 |
Imprint: |
2013
|
Conference: | SPIE Optical Metrology 2013, Munich, , Germany (Germany), 2013-05-13 - 2013-05-16 |
Document Type: |
Conference Presentation |
Research Program: |
Thin Film Photovoltaics |
Publikationsportal JuSER |
Description not available. |