This title appears in the Scientific Report :
2013
Please use the identifier:
http://dx.doi.org/10.1021/es403995b in citations.
Synthesis of coffinite, USiO4, and structural investigations of the UxTh(1-x)SiO4 solid solutions
Synthesis of coffinite, USiO4, and structural investigations of the UxTh(1-x)SiO4 solid solutions
The miscibility behavior of the USiO4 – ThSiO4 system was investigated. The end members and ten solid solutions UxTh(1-x)SiO4 with x = 0.12 – 0.92 were successfully synthesized, without formation of other secondary uranium or thorium phases. Lattice parameters of the solid solutions evidently follow...
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Personal Name(s): | Labs, Sabrina (Corresponding author) |
---|---|
Hennig, Christoph / Weiss, Stephan / Curtius, Hildegard / Zänker, Harald / Bosbach, Dirk | |
Contributing Institute: |
Nukleare Entsorgung; IEK-6 |
Published in: | Environmental science & technology, xx (2013) S. xx |
Imprint: |
Columbus, Ohio
American Chemical Society
2013
|
DOI: |
10.1021/es403995b |
Document Type: |
Journal Article |
Research Program: |
Safety Research for Nuclear Waste Disposal |
Publikationsportal JuSER |
The miscibility behavior of the USiO4 – ThSiO4 system was investigated. The end members and ten solid solutions UxTh(1-x)SiO4 with x = 0.12 – 0.92 were successfully synthesized, without formation of other secondary uranium or thorium phases. Lattice parameters of the solid solutions evidently follow Vegard's Law. Investigation of the local structure with EXAFS reveals small differences between U and Th environment attributed to different atomic radii of the metal atoms but no implications for a miscibility gap. The data provided confirms complete miscibility for the system USiO4 – ThSiO4. The structure of the end members was studied in detail with XRD and discussed with special regard to the oxygen positions and the often neglected Si-O bond length. USiO4 could be obtained without UO2 impurities and the lattice parameters derived from Rietveld refinement as c = 6.2606(3) Å and a = 6.9841(3) Å. The Si-O distance in USiO4 appears to be 1.64 Å, which is more reasonable than earlier reported values. |