Sedghi, N., Mitrovic, I., Hall, S., Lopes, J., & Schubert, J. (2011). CV measurements on LaLuO3 stack metal-oxide-semiconductor capacitor using a new three-pulse technique. New York, NY: Inst.
Chicago Style CitationSedghi, N., I.Z Mitrovic, S. Hall, J.M.J Lopes, andfavorite J. Schubert. CV Measurements On LaLuO3 Stack Metal-oxide-semiconductor Capacitor Using a New Three-pulse Technique. New York, NY: Inst, 2011.
MLA CitationSedghi, N., et al. CV Measurements On LaLuO3 Stack Metal-oxide-semiconductor Capacitor Using a New Three-pulse Technique. New York, NY: Inst, 2011.
Warning: These citations may not always be 100% accurate.