Description: Analysis of light propagation in thin-film solar cells by dual-probe scanning near-field optical microscopy

This title appears in the Scientific Report : 2014

Analysis of light propagation in thin-film solar cells by dual-probe scanning near-field optical microscopy

In this study, light propagation in textured hydrogenated microcrystalline silicon (μc-Si:H) thin-film solar cells is investigated on a sub-micron-scale by means of dual-probe scanning near-field optical microscopy (SNOM). Applying advanced modes of operation - exclusively available at dual probe SN...

Personal Name(s):	Lehnen, Stephan (Corresponding Author)
	Paetzold, Ulrich W. / Ermes, Markus / Bittkau, Karsten / Carius, Reinhard
Contributing Institute:	Photovoltaik; IEK-5
Imprint:	2014
Physical Description:	5
DOI:	10.1109/PVSC.2014.6925652
Conference:	40th IEEE Photovoltaic Specialist Conference, Denver, CO (USA), 2014-06-09 - 2014-06-13
Document Type:	Contribution to a conference proceedings
Research Program:	Thin Film Photovoltaics
Link:	OpenAccess
	Publikationsportal JuSER

Please use the identifier: http://dx.doi.org/10.1109/PVSC.2014.6925652 in citations.
Please use the identifier: http://hdl.handle.net/2128/8030 in citations.

In this study, light propagation in textured hydrogenated microcrystalline silicon (μc-Si:H) thin-film solar cells is investigated on a sub-micron-scale by means of dual-probe scanning near-field optical microscopy (SNOM). Applying advanced modes of operation - exclusively available at dual probe SNOMs - light propagation is analyzed with subwavelength resolution. Measurements at μc-Si:H thin-film solar cells layer are presented visualizing the influence of local surface features on light propagation. Furthermore, the intensity decay of light guided inside the solar cell is mapped. The observed intensity decay agrees well with theory, verifying the validity of the method.