This title appears in the Scientific Report :
2015
Please use the identifier:
http://dx.doi.org/10.1111/jace.13416 in citations.
Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography
Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography
Synchrotron X-ray computed nanotomography (nCT) and Focused Ion Beam–Scanning Electron Microscope nanotomography (FIB-nT) were used to characterize baked-out and sintered nickel (Ni) electrode–Multilayer Ceramic Capacitors. The three-dimensional microstructures obtained by two different tomography t...
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Personal Name(s): | Yan, Zilin (Corresponding Author) |
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Guillon, Olivier (Corresponding Author) / Martin, Christophe L. / Wang, Steve / Lee, Chul-Seung / Charlot, Frederic / Bouvard, Didier / Randall, Clive Alan | |
Contributing Institute: |
Werkstoffsynthese und Herstellungsverfahren; IEK-1 JARA-ENERGY; JARA-ENERGY |
Published in: | Journal of the American Ceramic Society, 98 (2015) 4, S. 1338-1346 |
Imprint: |
Oxford [u.a.]
Wiley-Blackwell
2015
|
DOI: |
10.1111/jace.13416 |
Document Type: |
Journal Article |
Research Program: |
Addenda |
Publikationsportal JuSER |
Synchrotron X-ray computed nanotomography (nCT) and Focused Ion Beam–Scanning Electron Microscope nanotomography (FIB-nT) were used to characterize baked-out and sintered nickel (Ni) electrode–Multilayer Ceramic Capacitors. The three-dimensional microstructures obtained by two different tomography techniques were quantified and correlated. X-ray nCT is sufficient to reveal the pore characteristics, whereas the FIB-nT enables the particles in the initial packings to be identified. In the dielectric ceramic layers, pores preferentially orient horizontally in the layer and the regions near the Ni/BT interface are denser than the inner regions. This anisotropy is possibly caused by compressive stress induced during the heating stage. |