This title appears in the Scientific Report :
2014
Please use the identifier:
http://dx.doi.org/10.1063/1.4898008 in citations.
Please use the identifier: http://hdl.handle.net/2128/17330 in citations.
Photocurrent collection efficiency mapping of a silicon solar cell by a differential luminescence imaging technique
Photocurrent collection efficiency mapping of a silicon solar cell by a differential luminescence imaging technique
A differential electroluminescence imaging method for solar cells which yields local photocurrent collection efficiency maps is introduced. These maps attribute a value between zero and unity to each location on the cell. This value corresponds to the ratio between the current at the cell terminals...
Saved in:
Personal Name(s): | Rau, Uwe (Corresponding Author) |
---|---|
Huhn, V. / Stoicescu, L. / Schneemann, M. / Augarten, Y. / Gerber, A. / Pieters, Bart | |
Contributing Institute: |
Photovoltaik; IEK-5 |
Published in: | Applied physics letters, 105 (2014) S. 163507 |
Imprint: |
Melville, NY
American Inst. of Physics
2014
|
DOI: |
10.1063/1.4898008 |
Document Type: |
Journal Article |
Research Program: |
Helmholtz Interdisciplinary Doctoral Training in Energy and Climate Research (HITEC) Thin Film Photovoltaics |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/17330 in citations.
A differential electroluminescence imaging method for solar cells which yields local photocurrent collection efficiency maps is introduced. These maps attribute a value between zero and unity to each location on the cell. This value corresponds to the ratio between the current at the cell terminals and the locally generated photocurrent. The method is demonstrated for a multicrystalline silicon solar cell under constant illumination. If the point of maximum power output of the cell is chosen as the bias point, the method yields quantitative information on the local contribution to the maximum output power of the solar cell. |